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MSE 854 Characterization of Materials
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Campus
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SCME
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Programs
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PG
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Session
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Fall Semester 2016
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Course Title
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Characterization of Materials
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Course Code
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MSE 854
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Credit Hours
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3
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Pre-Requisutes
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Course Objectives
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- The student should be equipped with in depth knowledge about the working principles of different characterization techniques.
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Detail Content
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Structural Characterization, X Ray diffraction patterns,
- Quantitative and Qualitative analysis and Atomic Force Microscopy.
- Energy dispersive and wavelength dispersive analysis, thermal analysis,
- Differential Calorimetry, Thermal Gravimetric analysis,
- Molecular spectroscopy techniques, IR Spectroscopy, Gamma Ray Spectroscopy,
- Raman Spectroscopy, Nuclear Magnetic Resonance, Auger Spectroscopy, Atomic Force Microscopy.
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Text/Ref Books
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- Fundamentals of Molecular Spectroscopy (Banwell&McCash) Mcgraw-Hill College; 4 Sub edition (June 1, 1994)
- Characterization in Silicon Processing (Yale E Strausser) Momentum Press; Reprint edition (January 1, 2010)
- Characterization of Organic Thin Films (Abraham Ulman) Momentum Press (2009)
- Applied Laser Spectroscopy (David L Andrews) Wiley; 1 edition (December 10, 1992)
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Time Schedule
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Fall Semester 2014
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Faculty/Resource Person
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- Dr. ZakirHussain
Degree : (PhD), Technical University of Braunschweig, Germany.
- Dr. Amir Habib
Degree : PhD, Analytical and Technical Chemistry: University of Technology Vienna, Austria.
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