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MSE-854 Characterization of Materials
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Campus
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SCME
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Programs
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PG
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Session
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Fall Semester 2016
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Course Title
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Characterization of Materials
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Course Code
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MSE-854
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Credit Hours
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3
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Pre-Requisutes
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Nil
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Course Objectives
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- To equip the graduates with in depth knowledge about the working principles of different characterization techniques.
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Detail Content
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- Structural Characterization, X Ray diffraction patterns
- Quantitative and Qualitative analysis
- Energy dispersive and wavelength dispersive analysis, thermal analysis
- Differential Calorimetry, Thermal Gravimetric analysis
- Molecular spectroscopy techniques, IR Spectroscopy, Gamma Ray Spectroscopy
- Raman Spectroscopy, Nuclear Magnetic Resonance
- Auger Spectroscopy, Atomic Force Microscopy
Course Outcomes
- The student will be able to use different characterization techniques for research applications such as determination of crystal structure of as synthesized inorganic materials using XRD or understanding the fractograph of a turbine blade etc.
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Text/Ref Books
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- Fundamentals of Molecular Spectroscopy, McCash & McGraw-Hill, 1995.
- Characterization in Silicon Processing, Yale E Strausser et al, Butterworth-Heinemann, 1993, ISBN: 9780750691727.
- Characterization of Organic Thin Films, Abraham Ulman, Butterworth-Heinemann, 1994, ISBN: 9780750694674.
- Applied Laser Spectroscopy, David L Andrews, VCH, Weinheim 1992.
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Time Schedule
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Faculty/Resource Person
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